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Continuous Technological Innovation
Provide one-stop optical measurement solutions for customers
Silicon Photoelectric OLED Panel Lifetime Testing System

Silicon Photoelectric OLED Panel Lifetime Testing System


Measurement Functions

It uses silicon photoelectric sensors to test the relative luminance decay ratio of modules or panels. It can be paired with a high-low temperature chamber or constant temperature and humidity chamber to simulate ambient temperature and humidity, featuring fast testing speed and small footprint.


The main unit consists of a test cabinet and a constant temperature chamber (optional).

  1. The constant temperature chamber can be optionally equipped with multiple chambers, each of which can perform independent temperature and humidity control. Temperature and humidity control parameters can be set via software and automatically recorded in reports during each lifetime test.
  2. Each constant temperature chamber is divided into 4 layers for placement. Each layer can hold one set of fixtures, and each set of fixtures can test 5 OLED MDLs or panels simultaneously.
  3. Inside the test cabinet, the test computer host, multiplexing digital multimeter (Keithley 3706A), silicon photoelectric test circuit board, signal generator, cabinet control circuit, UPS, etc., are placed.
  4. Silicon photoelectric sensors are fixed on the fixtures, aligned with the center of each OLED module or panel. To adapt to testing panels of different sizes, the position of silicon photoelectric sensors can be manually adjusted in the XY direction.


Measurement Items

  1. Relative luminance decay ratio over time under white/red/green/blue/user-specified images, with curves plotted.
  2. Voltage or current variation data over time, with curves plotted.
  3. Estimated lifetime calculation.


System Features

  1. Group testing support: Different groups can be configured with different test items and parameters, and each group can start and stop independently.
  2. Lifetime test time intervals and interval settings: Three time intervals and test intervals can be set.
  3. Lifetime test termination condition judgment: Measurement stops when luminance decays to a specified percentage of the initial value, or according to the total time set by the user.
  4. Lifetime prediction function: The software has a built-in lifetime prediction formula that automatically calculates the estimated lifetime based on real-time measured data.
  5. Real-time saving and recovery of measured data: The software saves data in real time during testing. Even if the computer shuts down abnormally or the software exits unexpectedly, previous data can be loaded and measurement can resume after restarting.
  6. The software can set a group of warm-up images, and the OLED cycles through these images during the waiting period between tests.
  7. Supports barcode scanning and data upload to the server (upload protocol to be provided by the customer).


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Suzhou Fstar Scientific Instrument Co.,Ltd. was founded in 2006, with its headquarters located in Suzhou Industrial Park. It has established branch offices and offices in Shenzhen, Chongqing, Wuhan, Xiamen and other cities. It is a high-tech enterprise specializing in optical instruments and testing systems.
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