Silicon photoelectric lifetime testing platforms offer an economical solution for OLED device lifetime testing. However, due to the mismatch between the visible light spectral response curve of silicon photoelectric components and the CIE human eye luminous efficiency function, the measured relative luminance values become inaccurate when the device’s spectral shape changes or spectral peaks shift during lifetime decay.
To accurately measure the absolute luminance, chromaticity, and spectral changes of OLED devices during decay, Fstar has developed a spectrometer-scanning OLED device lifetime testing solution. A spectroradiometer is mounted on an XYZ automatic motion stage to scan the luminance, chromaticity, and spectral data of each device’s light-emitting point, generating time-dependent curves of luminance, chromaticity, and spectrum during the device’s lifetime decay process.
System Composition
- FS-GA3 Platform, including a 3-axis linear motion control module
- Spectroradiometer
- Automatic visual alignment industrial camera
- Multi-channel constant voltage/constant current output lifetime testing power supply
- Multi-channel voltage and current measurement module
- Multiple sets of device testing jigs (optional room temperature or independent temperature control)
- OLED device lifetime measurement software
- Industrial computer
Automatic Identification of Light-Emitting Point Positions
The OLED Device Lifetime Testing Platform is equipped with an industrial visual alignment camera. It automatically scans the placement positions of OLED devices in all stations before each measurement, identifies the center coordinates and dimensions of OLEDs without manual alignment, simplifying the operation process.
High Precision of Power Output and Measurement
The system employs the Keithley 3706A multiplexing digital multimeter to measure the output voltage and current of all channels. Meanwhile, the software corrects the power supply output based on the voltage and current values measured by the 3706A, resulting in a current output error of less than 2μA.
Software Functions
- Luminance measurement interval setting: Three time periods can be set, with each period allowing independent configuration of measurement intervals.
- Lifetime cutoff luminance ratio setting: Measurement stops automatically when the measured luminance ratio falls below the set threshold.
- Lifetime prediction: Generates lifetime estimates based on measured data.
- Pre-lighting function: Clicking this button lights up all selected measurement stations according to the set voltage or current output, enabling pre-measurement checks for abnormal lighting.
- Measured data includes: measurement time, voltage, current, elapsed testing duration, remaining luminance ratio, luminance value (cd/m²), chromaticity coordinates (x, y, u', v'), and CRI value. If spectral measurement is enabled, spectral data is automatically collected during each luminance measurement and saved independently in a report.
