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According to users' different testing requirements for temperature and humidity environments, additional equipment such as high-temperature chambers, high-low temperature chambers, and constant temperature & humidity chambers can be added to control the environment for device lifetime testing.
Its temperature control range, humidity control range, and multi-layer chamber design can all be customized according to customer requirements.
Fstar's silicon photoelectric lifetime testing machine system adopts a modular design, allowing flexible configuration of the testing system according to user needs. Before starting luminance measurement, it first measures and stores the dark current noise of each silicon photodiode. The optional constant temperature and humidity chamber can achieve control over the temperature and humidity of the testing environment, regulating the environment for device aging. Each measurement result of the silicon photoelectric current is automatically subtracted by the dark current noise, and luminance is calculated based on the net silicon photoelectric current.
Central control cabinet, including:
Environmental test chamber (optional)
Industrial computer
OLED device lifetime measurement software
Temperature range: -40～100 ℃ (standard type; other temperature ranges can be customized)
Temperature uniformity: ±2.0℃
Temperature fluctuation: ±0.5℃
Temperature accuracy: 1℃
Heating rate: 1.0～3.0℃/min
Cooling rate: 0.7～1.2℃/min
Humidity range: 30%～98%RH (standard type; other humidity ranges can be customized)
Humidity fluctuation: ±1.5% R.H
Humidity deviation: ±2.5% R.H
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