Multi-Chip OLED Device IVL + Viewing Angle Testing System

It is mainly applied in OLED material and OLED panel production factories to meet customers' needs for mass testing of IVL characteristics and luminance viewing angle characteristics of OLED devices.

System Features

1. Mass device testing
   The system is equipped with a multi-channel circuit selector, supporting sequential lighting and testing of up to 96 OLED devices (the specific number of devices and light-emitting points can be customized). All light-emitting points can be pre-lit before testing to confirm whether all devices are functioning normally.

2. Automatic alignment recognition of the center of the light-emitting area
   An industrial vision alignment CCD automatically identifies the position of light-emitting points. Whether testing IVL vertically or measuring viewing angle luminance by rotating the device, it always ensures that the measurement point is aligned with the center of the light-emitting area.

3. Wide viewing angle range testing
   Even for a 3×3mm light-emitting point, it can meet the testing requirement of over 75° viewing angle when measuring viewing angles. Meanwhile, the industrial vision alignment camera can correct measurement point deviations caused by rotation, ensuring that the measurement point remains aligned with the center of the device's light emission under a wide viewing angle.

4. Temperature kit expansion
   Each fixture can be optionally equipped with a temperature control chamber (temperature control range: -40–100℃).

Measurement Software

Settings for I-V-L Curve Measurement

1. Continuous measurement can be performed by setting the start voltage, end voltage, and voltage step.
2. Continuous measurement can be performed by setting the start current density, end current density, and current density step.
3. The lower limit for luminance detection of current density can be set independently; when below the lower limit, only current and voltage are measured; when exceeding the lower limit, data such as voltage, current, and luminance are measured simultaneously.
4. Set model parameters can be saved and directly retrieved for measurement next time.

I-V-L Measurement Data

The measurement results include: luminance L (cd/m²), current efficiency (mA/cm²), luminous efficiency, external quantum efficiency (EQE), chromatic coordinates (x, y), color temperature, color rendering index (CRI), and emission spectrum.

The charts included in the output measurement report are: Cdens-V, Cdens-L, Cdens-LumE, Cdens-EQE, CIE1931, and Spectra.

Software Interface